Warning over TOPCon and HJT reliability
- Admin
- Jun 6, 2024
- 1 min read
Failures in TOPCon cells and HJT cells have led to the call for cell-level testing to prevent degradation issues in next-generation solar cell technologies. Professor Bram Hoex from UNSW emphasized the need for new testing regimes to address emerging failure modes. The article discusses the importance of detailed cell-level testing, metallisation contamination, and the risks associated with new technologies moving into production quickly.
Source:
Want to read more?
Subscribe to vitaliydaviy.wixsite.com to keep reading this exclusive post.
