Warning over TOPCon and HTJ reliability

Failures in TOPCon cells and HJT cells have led to calls for cell-level testing to prevent degradation issues in next-generation solar cell technologies. Professor Bram Hoex emphasizes the importance of detailed testing to address emerging failure modes and stresses the significance of stability over efficiency in embracing new technologies.

Source:

https://www.pv-tech.org/warning-over-topcon-andhtj-reliability/

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